Testability design

A New Structure of Testability Design Using Partial Parallel Scan

部分并行扫描法可测性设计的一种新结构

Test Technique and Testability Design of Surface Mount Technology PCB

表面安装PCB板的测试方法及可测性设计

Initial study of support testability design methods for complicated system : Fault equipment effect analysis and its application

复杂系统使用保障测试性设计方法初探&故障设备影响分析及其应用

Application of testability design in the equipment for detection of synthetic photovoltaic radar parameters

可测试性在光电雷达检测设备中的应用

Research and Develop IEEE 1149 . 1 Testability Design

IEEE1149.1可测试性设计技术的研究与发展

The Method for Determining Testability Design Requirements

确定测试性设计要求的方法

From the development of computer-aided design , the testability design technology of electronic equipments was analyzed .

电子装备测试性设计技术的分析，从CAD的发展入手。

Low Power Technology of BIST Testability Design

BIST可测性设计的低功耗技术

Ordering storage elements in single scan testability design

单链扫描可测性设计中存储元件的排序

Optimal Testability Design of Circuit Boards Based on JTAG

基于JTAG的电路板可测性设计分析技术

Automatic Testability Design for Digital Circuits

数字电路可测试性的自动设计

Implement Testability Design on the Hardware

硬件模块可测试性设计的实现

Testability Design of Wireless Chip Based on ATPG

基于ATPG的无线接入芯片的可测试性设计

Ready testability design for logic circuits

逻辑电路易测性设计探讨

Air-to-Air Missile 's Testability Design Based on BST

基于BST的空空导弹测试性设计

Testability Design for Programmable Logic Arrays

可编程逻辑阵列的易测性设计

Design for test is an important process in the chip design nowadays , testability design of wireless chip needs a much higher requirement of test technology .

可测试性设计是现代芯片设计中的关键环节，针对无线接入芯片的可测试性设计对测试技术有更高的要求。

According to the software function and implementation of the general-purpose ATS for missile weapon systems , the analysis and study of testability design is given .

针对导弹通用自动测试系统的功能与实现，对系统的软件部分进行可测试性设计分析研究。

This paper presents the important action of the simulation fault injection in the testability design , and the important steps to complete the testability design using the simulation .

论述了仿真故障注入在测试性设计中的重要作用以及利用仿真进行测试性设计的几个重要环节。

BIT is one important testability design of electronic systems . It 's also one important way to test and insulate the failure in the electronic system or the internal equipment .

BIT（自检）是电子系统可测试性设计的重要组成部分，是电子系统或设备内部检测和隔离故障的重要手段。

According to the information disconnect problem of design-manufacturing-maintenance for complex electronic equipments , we put forward an integration idea for testability design and maintenance diagnosis .

针对目前复杂电子装备设计制造与维修保障中存在的信息脱钩问题，提出了装备测试性设计与维修诊断一体化思想；

How to determine the best test-points in faults diagnosis of dynamical systems is a very important problem and it is the main content of testability design .

在动态系统故障诊断中，如何选择测试位置是一个非常重要的问题，它是系统可测性设计的重要内容。

The experimental results confirmed that BIST testability design is feasible and practical . The design is a practical reference to electronic systems BIST and fault diagnosis strategy .

实验研究结果证实了本文提出的内建自测试可测性设计的有效性和实用性，对电子系统内建自测试及其故障诊断策略具有借鉴意义。

Besides , it is discovered that there are some merits for error signature analysis and testability design when binary counting sequences are used as the testing input .

此外，发现用二进计数序列作为测试输入对于差错特征量可测试性设计有一定优点。

Which lay the foundation for the boundary-scan test system ' development . 2 , Explore and design the testability design which are based on boundary scanning technique and MTM maintain bus technique .

为边界扫描测试系统的开发奠定基础。2、探索并设计了基于边界扫描技术和MTM维修总线技术的电路板板级和电子设备系统级的可测性设计，对电路设计人员具有可借鉴作用。

In this paper the concept of Built in Test ( BIT ) is introduced , a method for the testability design of avionic integrated equipment is proposed with emphasis on the BIT design of major parts .

本文介绍了机内自动测试（BIT）的基本概念，提出了一种解决航空电子综合化设备测试性设计的方法，并对设备中主要部分的BIT设计作了详细的阐述。

In this paper , the DFT standards series based on standard test bus are analyzed , and the testability design methods of applying boundary scan technology in board level test , system level test and products field maintenance are put forward .

在分析基于标准测试总线的测试性技术的标准体系之后，介绍了将边界扫描技术应用于板级测试，系统级测试以及产品现场维护的测试性设计的一种方法。

During system design phase , we can use DRR model to go on testability design . By redefining the cardinality of set , we establish the relationship between the domain / range ratio and the testability metric .

在系统设计阶段可以运用DRR模型进行可测试性度量，本文对集合的势进行了重新的定义，在此基础上建立了定义域和值域的势的比值与软件的可测试度之间的关系。

The vertical test testability design requests ensure the consistency and compatibility for test and diagnosis during the whole life cycle of weapon equipments . The study is important to improve the testability level and realize integral test for the weapon equipments .

纵向测试性设计要求保证了武器装备全寿命周期测试诊断的一致性和兼容性，该研究对提高武器装备的测试性水平和实现武器装备一体化测试，具有重要意义。

In this paper , a new synthesis method for the testability design of digital circuits is proposed , so that the testability design of the circuits is achieved automatically by means of solving a corresponding mathematical programming problems in the course of logical design .

文章借助于数学规划手段完成了数字电路可测试性的自动设计，使电路在设计阶段就能保证有一定的可测试性。